Characterizing mid-circuit measurements with a new form of gate set tomography part 1: Theory
ORAL
Abstract
While quantum circuits end with measurements, they can also include measurements in the middle. Such mid-circuit measurements are required for real-time feedforward control applications, such as quantum error correction. Understanding error processes in these mid-circuit measurements will be critical for building next-generation quantum processors. To that end, we extend gate set tomography (GST), a highly accurate and self-consistent protocol for diagnosing quantum gate errors, to be able to also characterize mid-circuit measurements. We will describe this extension and demonstrate its success in simulations.
*This material is based upon work supported by the U.S. Army Research Office under Contract No: W911NF-14-C-0048. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the U.S. Army Research Office. Sandia National Labs is managed and operated by National Technology and Engineering Solutions of Sandia, LLC, a subsidiary of Honeywell International, Inc., for the U.S. Dept. of Energy’s National Nuclear Security Administration under contract DE-NA0003525. The views expressed in this presentation do not necessarily represent the views of the DOE or the U.S. Government.
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Presenters
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Kenneth Rudinger
- Sandia National Laboratories
- Quantum Performace Lab, Sandia National Laboratories
- Sandia National Laboratory
- Quantum Performance Laboratory, Sandia National Laboratories