Toward practical quantum-enhanced microscopies
· Invited
Abstract
Quantum light sources are increasingly essential to the development of the next generation of sensors and microscopes. While squeezed light exhibiting quantum noise reduction has been leveraged to enable quantum-enhanced measurements of microcantilever beam displacement [1], substantial further improvements are required to enable realistic quantum-enhanced scanning probe microscopy. We will discuss an approach to scanning probe microscopy based on truncated nonlinear interferometry that enables minimum photon back-action noise while also operating below the photon shot noise limit [2]. Further, we will explore photon correlation measurements in cathodoluminescence microscopies as a path toward the sub-diffraction-limited characterization of single color centers and excitons in nanostructured and 2D materials.
[1] R.C. Pooser and B.J. Lawrie, Optica 2, 393, (2015)
[2] arXiv:1912.10550
[1] R.C. Pooser and B.J. Lawrie, Optica 2, 393, (2015)
[2] arXiv:1912.10550
*This research was supported by the U. S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. The experimental concept was conceived and initial experiments were performed as part of the Laboratory-Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the U.S. Department of Energy.
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Presenters
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Benjamin J Lawrie
- Oak Ridge National Laboratory