Superconducting Sr<sub>2</sub>RuO<sub>4</sub> thin film growth by controlling the structural defects
ORAL
Abstract
The layered perovskite superconductor Sr2RuO4 (bulk Tc ~ 1.5 K) has been studied extensively with its possible topological superconductivity and chiral gap function (px ± ipy) [1]. The superconducting Sr2RuO4 thin film has advantages not only for physical advances but also fruitful device application such as quantum computation [2]. However, superconducting Sr2RuO4 film growth has been limited since the superconductivity of Sr2RuO4 is extremely vulnerable to structural defects, especially out-of-phase boundaries (OPBs) [3].
In this presentation, we will present our Sr2RuO4 film growth focused on the suppression of OPBs. By optimizing substrates and growth condition, we achieved epitaxial Sr2RuO4 films with high crystallinity and smooth surfaces, confirmed by X-ray diffraction and atomic force microscopy and transmission electron microscopy. With reduced OPBs, Sr2RuO4 films exhibit superconductivity up to 0.8 K. Our work suggests a novel method to obtain superconducting Sr2RuO4 films enabling Josephson junction or spintronics device based on the Sr2RuO4.
[1] A. P. Mackenzie and Y. Maeno, Rev. Mod. Phys. 75, 657 (2003).
[2] T. Hyart et al., Phys. Rev. B 88, 035121 (2013).
[3] M. A. Zurbuchen et al., Appl. Phys. Lett. 78, 2351 (2001).
[4] M. Uchida et al., APL Materials 5, 106108 (2017).
In this presentation, we will present our Sr2RuO4 film growth focused on the suppression of OPBs. By optimizing substrates and growth condition, we achieved epitaxial Sr2RuO4 films with high crystallinity and smooth surfaces, confirmed by X-ray diffraction and atomic force microscopy and transmission electron microscopy. With reduced OPBs, Sr2RuO4 films exhibit superconductivity up to 0.8 K. Our work suggests a novel method to obtain superconducting Sr2RuO4 films enabling Josephson junction or spintronics device based on the Sr2RuO4.
[1] A. P. Mackenzie and Y. Maeno, Rev. Mod. Phys. 75, 657 (2003).
[2] T. Hyart et al., Phys. Rev. B 88, 035121 (2013).
[3] M. A. Zurbuchen et al., Appl. Phys. Lett. 78, 2351 (2001).
[4] M. Uchida et al., APL Materials 5, 106108 (2017).
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Presenters
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Jinkwon Kim
- Center for Correlated Electron Systems (CCES), Institute for Basic Science (IBS)
- Department of Physics and Astronomy, Seoul National University