Nanocharacterization of 2D Hybrid Materials by Near-Field Microscopy
ORAL
Abstract
Methods of Near-Field Microscopy are high-throughput non-destructive techniques, which can be used for characterization of 2D Hybrid Materials with sub-micrometer resolution as well as for device inspection. Here we show near field data on 2D samples with various electronic properties, from metals to semiconductors. Simple physical models are proposed for near-field analysis.
*To the Pennsylvania State University 2DCC-MIP supported by NSF cooperative agreement DMR-1539916. To the JSNN, a member of Southeastern Nanotechnology Infrastructure Corridor (SENIC) and National Nanotechnology Coordinated Infrastructure (NNCI), supported by NSF ECCS-1542174. To the UNCG Faculty First Award.
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Presenters
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Tetyana Ignatova
- Joint School of Nanoscience and Nanoengineering, University of North Carolina at Greensboro
- Nanoscience, Univ of NC - Greensboro