Gate-Dependent Transport in Multi-Terminal Josephson Junctions

ORAL

Abstract

Josephson coupling of three or more superconducting leads through a material with few conducting modes has been predicted to give rise to topological effects. Such behavior, of relevance for topologically-protected quantum bits, would lead to specific transport features measured between terminals, with topological phase transitions occurring as a function of relative phase and voltage biases. Here we study the effects on transport of several top-gating arrangements on multi-terminal Josephson junctions with many conducting modes based on an InAs 2DEG proximitized with an epitaxial aluminum layer and many conducting modes. The superconducting features can be accurately simulated by a network of RCSJ junctions. [1]

1. G. V. Graziano, J. S. Lee, M. Pendharkar, C. J. Palmstrom and V. S. Pribiag. arXiv:1905.11730 (2019)

*This work was supported primarily by the National Science Foundation under Award No. DMR-1554609. The work at UCSB was supported by the Department of Energy under Award No. DE-SC0019274. The development of the epitaxial growth process was supported by Microsoft Research.

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Presenters

  • Gino Graziano

    • University of Minnesota

Authors

  • Gino Graziano

    • University of Minnesota

  • Joon Sue Lee

    • California Nano-Systems Institute, Univ. of California, Santa Barbara, CA, USA
    • University of Tennessee Knoxville
    • Univ of California, Santa Barbara
    • Physics & Astronomy, Seoul National University
    • University of California Santa Barbara
    • California Nanosystems Institute, University of California Santa Barbara
    • University of California, Santa Barbara

  • Sean Harrington

    • Materials Department, University of California, Santa Barbara
    • Dept. of Materials Engineering, Univ. of California, Santa Barbara, CA, USA
    • IEE, UC Santa Barbara
    • Univ of California, Santa Barbara
    • University of California, Santa Barbara

  • Mihir Pendharkar

    • Dept. of Electrical Engineering, Univ. of California, Santa Barbara, CA, USA
    • IEE, UC Santa Barbara
    • University of California Santa Barbara
    • Univ of California, Santa Barbara
    • Electrical and Computer Engineering, University of California Santa Barbara
    • Electrical & Computer Engineering, University of California, Santa Barbara
    • University of California, Santa Barbara

  • Chris J Palmstrom

    • Materials Department, University of California, Santa Barbara
    • UCSB
    • Departments of Electrical and Computer Engineering and Materials, University of California, Santa Barbara
    • Dept. of Electrical Engineering, Univ. of California, Santa Barbara, CA, USA
    • Univ. of California, Santa Barbara
    • Electrical and Computer Engineering Department, University of California, Santa Barbara
    • University of California, Santa Barbara
    • IEE, UC Santa Barbara
    • University of California Santa Barbara
    • Univ of California, Santa Barbara
    • Electrical and Computer Engineering, University of California Santa Barbara
    • Materials and Electrical & Comp. Eng, University of California, Santa Barbara

  • Vlad Pribiag

    • University of Minnesota
    • School pf Physics and Astronomy, University of Minnesota
    • School of Physics and Astronomy, University of Minnesota