Single-molecule orientation mapping in 3D using a novel optical design
ORAL
Abstract
Single molecule (SM) localization-based super-resolution techniques have revolutionized the application of optical microscopy because of their ability to image structures below the diffraction limit in widefield. Fluorescent dyes and proteins used for SM imaging absorb and emit photons via an emission dipole, and any restriction on the motion of the dipole creates an asymmetry in the observation of the emission. Mapping this dipolar orientation can be a useful reporter of the local environment of molecules, and help improve localization accuracy for super-resolution imaging. We present a simple and flexible optical design, that can be incorporated into a standard optical microscope, to enable mapping the orientation of single molecules by simultaneously imaging 4 polarization orientations. A single camera is used to acquire all 4 channels, and fine adjustment controls for each channel minimize optical aberrations. We have used nanofabricated aperture arrays, fluorescent beads and single molecules embedded in a polymer matrix to characterize the system.
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Presenters
Abhishek Kumar
University of Maryland, College Park
Authors
Abhishek Kumar
University of Maryland, College Park
James M Marr
Materials Measurement Laboratory, National Institute of Standards and Technology
Materials Measurement Laborator, National Institute of Standards and Technology
Anthony Mautino
University of Maryland, College Park
Mark McLean
Materials Measurement Laboratory, National Institute of Standards and Technology
Materials Measurement Laborator, National Institute of Standards and Technology
Jeremiah Woodcock
Materials Measurement Laboratory, National Institute of Standards and Technology
National Institute of Standards and Technology
Jefrey Gilman
Materials Measurement Laboratory, National Institute of Standards and Technology
NIST
National Institute of Standards and Technology
Stephan Stranick
Materials Measurement Laboratory, National Institute of Standards and Technology
Materials Measurement Laborator, National Institute of Standards and Technology
National Institute of Standards and Technology
Veronika Szalai
Physical Measurement Laboratory, National Institute of Standards and Technology
James Liddle
Physical Measurement Laboratory, National Institute of Standards and Technology