Surface Loss Characterization and Comparison in Aluminum, Niobium, and Titanium Nitride Superconducting Resonators
ORAL
Abstract
Uniquely characterizing loss from two-level systems (TLS) at metal-substrate, metal-air, and substrate-air interfaces and in a dielectric substrate is challenging due to the nearly proportional scaling of the dielectric participations in response to changes in geometry and anisotropic trench depth. We developed a technique utilizing isotropic etching to assign a specific loss tangent to each dielectric, and use that to determine the dominant dielectric losses for a specific fabrication process, enabling targeted geometry and process changes to maximize performance. In this talk, we characterize the loss from high quality factor resonators (Qi>1M) for aluminum, titanium nitride, and niobium, and demonstrate the technique’s application by targeting specific defect layers to alter the dielectric losses specifically from these defect layers.
*This material is based upon work supported in part by the Intelligence Advanced Research Projects Activity (IARPA) and in part by the Department of Defense under Air Force Contract No. FA8721-05-C-0002 and/or FA8702-15-D-0001. Any opinions, findings, conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of IARPA, the Department of Defense, or the US Government.
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Presenters
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Alexander Melville
- MIT Lincoln Lab
- MIT Lincoln Laboratory
- Massachusetts Institute of Technology
- Lincoln Laboratory, Massachusetts Institute of Technology
- MIT Lincoln Laboratory, 244 Wood Street, Lexington, MA 02421
- MIT Lincoln Laboratory, Massachusetts Institute of Technology