Terahertz Interferometric Microscopy
POSTER
Abstract
We report on the development of a continuous wave near-field scanning microscope operating in the 500-600GHz frequency range. The use of interferometric detection allows for enhanced sensitivity and the use of low cost thermal detectors even when using a low power radiation source. We present representative images of both soft and hard matter samples.
*Work funded by CONACyT CB253754, Fronteras 344 and PAPIIT UNAM IN106316.
Presenters
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Naser Qureshi
- ICAT, Universidad Nacional Autónoma de México