Closing the surface bandgap in thin Bi<sub>2</sub>Se<sub>3</sub>/graphene heterostructures

ORAL

Abstract

Topological insulator (TI), a band insulator with topologically protected edge states, is one of the most interesting materials in the field of condensed matter. For application, suppression of the bulk effect is crucial, but in ultrathin TI materials, with thicknesses less than 3 QL, the surface band has a finite bandgap because of the hybridization between the top and bottom surface states. Here, we studied the gapless top surface Dirac state of strained 3 QL Bi2Se3/graphene heterostructures. A strain caused by the graphene layer reduces the bandgap of surface states, and the band bending resulting from the charge transfer at the Bi2Se3-graphene interface induces localization of surface states to each top and bottom layer to suppress the overlap of the two surface states. In addition, we verified the independent transport channel of the top surface Dirac state in Bi2Se3/graphene heterostructures by measuring the magneto-conductance. Our findings suggest that the strain and the proximity effect in TI/non-TI heterostructures may be feasible ways to engineer the topological surface states beyond the physical and topological thickness limit.

*This work was supported by the National Research Foundation of Korea grant (Grant No. 2018R1A2A1A05023214)

Presenters

  • Jimin Chae

    • Department of Physics, Yonsei University

Authors

  • Jimin Chae

    • Department of Physics, Yonsei University
  • Seoung-Hun Kang

    • Korea Institute for Advanced Study
  • Sang Han Park

    • Pohang Accelerator Laboratory
  • Hanbum Park

    • Department of Physics, Yonsei University
  • Kwangsik Jeong

    • Department of Physics, Yonsei University
  • Tae-hyeon Kim

    • Department of Physics, Yonsei University
  • Seok-bo Hong

    • Department of Physics, Yonsei University
  • Keun Su Kim

    • Department of Physics, Yonsei University
  • Young-Kyun Kwon

    • Department of Physics and Research Institute for Basic Sciences, Kyung-Hee University
  • Jwong Won Kim

    • Division of Industrial Metrology, Korea Research Institute of Standards and Science
  • Mann-Ho Cho

    • Department of Physics, Yonsei University