Layer Dependent MCD on Van der Waal-like 2D ferromagnetism
ORAL
Abstract
The layered ferromagnetic semiconductor CrSiTe3 is a promising candidate for spintronic applications. According to DFT calculations, its bulk bandgap is predicted to be ~0.4 eV; meanwhile, a Curie temperature of ~33 K was reported, thus providing evidence for bulk ferromagnetism. More importantly, due to the van der Waal-like interlayer coupling, CrSiTe3 is exfoliable and possible to achieve monolayers through mechanical exfoliation making it appealing for 2D spintronics. However, the fundamental properties of CrSiTe3 have not been thoroughly studied, particularly in the few layers limit. . A number of of theoretical reports, suggest that the monolayer could have a larger bandgap but the presence of magnetism is still debatable (FM or AFM order). Nonetheless, among these predictions, the common agreement is that the decisive factor causing FM- or AFM-exchange coupling is the distance between Cr-Te-Cr bonds, which indicates that the spin configuration is closely related to the lattice. Therefore, In order to study the presence of magnetism and to understand the role spin-phonon interaction, we performed layer-dependent magnetization measurements via the magnetic circular dichroism (MCD) and Raman spectroscopy at different Ts.
*DOE-BES (Award No. DE-SC0002613). NSF/DMR-1644779.
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Presenters
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Yu-Che Chiu
- National High Magnetic Field Laboratory
- Florida State University