Defects in Semiconductors -- Wide Band Gap

FOCUS · K11 ·

Presentations

  • ORAL

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    Presenters

    • Hartwin Peelaers

      • Department of Physics and Astronomy, University of Kansas
      • University of Kansas

    Authors

    • Hartwin Peelaers

      • Department of Physics and Astronomy, University of Kansas
      • University of Kansas

    • John Lyons

      • Center for Computational Materials Science, US Naval Research Laboratory
      • United States Naval Research Laboratory

    • Joel Basile Varley

      • Lawrence Livermore National Laboratory

    • Chris Van de Walle

      • University of California, Santa Barbara
      • Materials Department, University of California, Santa Barbara
      • University of California, Santa Barbara, CA 93106, USA

    View abstract →

  • ORAL

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    Presenters

    • Mo Ahoujja

      • Physics, The University of Dayton

    Authors

    • J Hendricks

      • Air Force Institute of Technology, Wright-Patterson AFB, OH

    • Mo Ahoujja

      • Physics, The University of Dayton

    • Shin Mou

      • Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, OH

    • Adam T Neal

      • Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, OH

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  • ORAL

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    Presenters

    • Fernando Sabino

      • Department of Material science and Engineering, University of Delaware
      • Department of Physics & Astronomy, University of Delaware
      • Materials Science and Engineering, University of Delaware

    Authors

    • Fernando Sabino

      • Department of Material science and Engineering, University of Delaware
      • Department of Physics & Astronomy, University of Delaware
      • Materials Science and Engineering, University of Delaware

    • Suhuai Wei

      • Beijing Computational Science Research Center

    • Anderson Janotti

      • Department of Material science and Engineering, University of Delaware
      • Department of Physics & Astronomy, University of Delaware
      • Materials Science and Engineering, University of Delaware
      • University of Delaware
      • Department of Materials Science & Engineering, University of Delaware
      • Department of Materials Science and Engineering, University of Delaware

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  • ORAL

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    Presenters

    • Mark E. Turiansky

      • University of California, Santa Barbara
      • Department of Physics, University of California, Santa Barbara

    Authors

    • Mark E. Turiansky

      • University of California, Santa Barbara
      • Department of Physics, University of California, Santa Barbara

    • Jimmy Shen

      • University of California, Santa Barbara
      • Department of Physics, University of California, Santa Barbara

    • Darshana Wickramaratne

      • NRC Research Associate residing at, US Naval Research Laboratory, Washington, DC 20375, USA
      • Naval Research Laboratory
      • Materials Department, University of California, Santa Barbara
      • University of California, Santa Barbara

    • Chris Van de Walle

      • University of California, Santa Barbara
      • Materials Department, University of California, Santa Barbara
      • University of California, Santa Barbara, CA 93106, USA

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  • ORAL

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    Presenters

    • Jiaheng He

      • Department of Materials Science and Engineering, University of Michigan

    Authors

    • Jiaheng He

      • Department of Materials Science and Engineering, University of Michigan

    • Guanjie Cheng

      • Department of Materials Science and Engineering, University of Michigan

    • Davide Del Gaudio

      • Materials Science and Engineering, University of Michigan
      • Department of Materials Science and Engineering, University of Michigan

    • Jordan M Occena

      • Department of Materials Science and Engineering, University of Michigan
      • Materials Science and Engineering, University of Michigan

    • Fabian Naab

      • Michigan Ion Beam Laboratory, University of Michigan

    • Rachel Goldman

      • Materials Science and Engineering, university of Michigan
      • Materials Science and Engineering, University of Michigan
      • Materials Science & Engineering, University of Michigan - Ann Arbor
      • Department of Materials Science and Engineering, University of Michigan

    • Mohsen Nami

      • Department of Electrical Engineering, Yale University

    • Bingjun Li

      • Department of Electrical Engineering, Yale University

    • Jung Han

      • Department of Electrical Engineering, Yale University

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  • ORAL

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    Presenters

    • Ruoqiao Wei

      • Lehigh University

    Authors

    • Ruoqiao Wei

      • Lehigh University

    • Brandon Mitchell

      • West Chester University

    • Dolf Timmerman

      • Osaka University

    • Tom Gregorkiewicz

      • University of Amsterdam

    • Wanxin Zhu

      • Osaka University

    • Yasufumi Fujiwara

      • Osaka University

    • Volkmar R G Dierolf

      • Lehigh University
      • Physics, Lehigh University

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  • ORAL

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    Presenters

    • Yifei Wang

      • Department of Physics & Center for Soft Matter and Biological Physics, Virginia Tech
      • Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech

    Authors

    • Yifei Wang

      • Department of Physics & Center for Soft Matter and Biological Physics, Virginia Tech
      • Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech

    • Ho Vinh

      • Department of Physics & Center for Soft Matter and Biological Physics, Virginia Tech
      • Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech

    • Vinh Q Nguyen

      • Department of Physics & Center for Soft Matter and Biological Physics, Virginia Tech
      • Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech

    View abstract →