Electrical Contacts in Monolayer Blue Phosphorene Devices

POSTER

Abstract

Semiconducting monolayer (ML) blue phosphorene (BlueP) shares similar stability with ML black phosphorene (BP) and has recently been grown on the Au surface. Potential ML BlueP devices often need a direct contact with metal to inject carrier. Using ab initio electronic structure calculations and quantum transport simulations, we perform a systematic study of the interfacial properties of ML BlueP in contact with metals spanning a wide work function range in a field effect transistor (FET) configuration for the first time.There is a strong Fermi level pinning (FLP) in the ML BlueP FETs due to the metal induced gap states (MIGS). The MIGS are eliminated by inserting graphene between ML BlueP and the metal electrode accompanied by a transition from a strong FLP to a weak FLP. Our study not only provides an insight into the ML BlueP-metal interfaces but also helps to design the ML BlueP device.

*This work was supported by the National Natural Science Foundation of China (Nos. 11274016/11474012/11674005/11274233/11664026), the National Basic Research Program of China (Nos. 2013CB932604/2012CB619304), Ministry of Science and Technology (Nos. 2016YFA0301300 and 2016YFB0700600 (National Materials Genome Project)) of China, Foundation of He’ nan Educational Committee (Grant No. 17A430026).

Presenters

  • Jingzhen Li

    • School of Enginnering Applied Science, Harvard University

Authors

  • Jingzhen Li

    • School of Enginnering Applied Science, Harvard University