Developments in X-ray full-field nano-tomography at the Advanced Photon Source for <i>in situ</i> characterization of battery and fuel cells

The Transmission X-ray Microscope (TXM) at beamline 32-ID of the Advanced Photon Source beamline at Argonne National Laboratory has been tailored for high throughput and high spatial resolution in operando nano-tomography experiments. Over the first 5 years of operations, it imposed as a very productive instrument, particularly in the domain of battery research. It benefits from the in-house development of cutting-edge X-ray optics, complex opto-mechanical components and a suite of software including Tomopy and other based on machine learning to push the limit of 3D nano-imaging while reducing total X-ray dose. It operates either with a moderate spatial resolution (40 - 50 nm) and large field of view of (~50 µm) or at very high spatial resolution (16 nm) at a smaller field of view (~10 µm). This presentation will give an overview of in situ experiments on batteries with different kind of cells, as well as our efforts for characterizing low-Z material like Li oxide, black carbon or polymers.