High temperature RIXS study of charge transfer excitations in cuprates
ORAL
Abstract
Resonant inelastic X-ray scattering (RIXS) is a promising technique to study momentum-resolved electronic excitations in strongly correlated materials. Here we present results of a recent Cu K-edge RIXS study on the archetypal hole-doped cuprate La2-xSrxCuO4 and electron-doped cuprate Nd2-xCexCuO4. Our measurements, which range from low temperature (15 K) to very high temperature (1200 K), indicate distinct spectral weight changes of charge-transfer excitations below ~ 2 eV. We will make a detailed comparison of the temperature dependent charge-transfer excitations in electron- and hole- doped cuprates.
*Work at the University of Minnesota funded by the Department of Energy through the University of Minnesota Center for Quantum Materials under DE-SC0016371.
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Presenters
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Biqiong Yu
- University of Minnesota
- School of Physics and Astronomy, University of Minnesota