Quantifying charge–to–spin conversion efficiency in magnetically–doped topological insulator heterostructures
ORAL
Abstract
We deployed a magneto–optical mangetometer and an electrical loop shift method to directly quantify the charge–to–spin conversion efficiency in a magnetically–doped topological insulator heterostructure. While these two approaches are essentially different in their experimental principles, quantitative agreements are found in values obtained by the two approaches. This consistency strongly suggests both methods can accurately estimate the charge–to–spin conversion efficiency without some ambiguity reported previously with other approaches. The charge–to–spin conversion efficiency, which is parameterized by the spin Hall angle tangent, is estimated to be 0.46 and 0.38 at 12K by the magneto–optical mangetometer and the electrical loop shift method, respectively. This value is at least one order larger than those of conventional heavy metals. Our results also reveal that magneto–optical mangetometer and loop shift methods are both reliable and easily accessible for investigation of magnetization dynamics in TI–based magnetic structures.
*We acknowledge the funding support from SHINES, MURI, TANMS, and the Army Research Office (ARO)
–
Presenters
Quanjun Pan
Electrical and Computer Engineering Department, University of California, Los Angeles
Authors
Quanjun Pan
Electrical and Computer Engineering Department, University of California, Los Angeles
Xiaoyu Che
Electrical Engineering, University of California, Los Angeles
ECE, UCLA
Electrical and Computer Engineering Department, University of California, Los Angeles
Qiming Shao
Electrical Engineering, University of California, Los Angeles
Electrical and Computer Engineering, University of California, Los Angeles
ECE, UCLA
University of California, Los Angeles
Electrical and Computer Engineering Department, University of California, Los Angeles
Department of Electrical Engineering, University of California, Los Angeles
Yabin Fan
Microsystems Technology Laboratories, MIT
Microsystems Technology Laboratories, Massachusetts Institute of Technology
Lei Pan
Electrical Engineering, University of California, Los Angeles
University of California, Los Angeles
University of California Los Angeles
Department of Electrical Engineering, University of California, Los Angeles
Electrical and Computer Engineering Department, University of California, Los Angeles
Hao Wu
Electrical and Computer Engineering, University of California, Los Angeles
University of California, Los Angeles
Electrical and Computer Engineering Department, University of California, Los Angeles
Peng Zhang
Department of Electrical Engineering, University of California, Los Angeles
Electrical and Computer Engineering Department, University of California, Los Angeles
Mohammad Montazeri
Electrical and Computer Engineering Department, University of California, Los Angeles
Kang L. Wang
University of California, Los Angeles
University of California Los Angeles
ECE, UCLA
Electrical and Computer Engineering Department, University of California, Los Angeles