In situ angle-resolved photoemission spectroscopy measurements of cuprate thin films grown by molecular beam epitaxy

ORAL

Abstract

Utilizing the oxide molecular beam epitaxy (MBE) in situ connected to beam-line angle-resolved photoemission spectroscopy (ARPES) in Stanford Synchrotron Radiation Lightsource (SSRL), high-quality cuprate films grown atomic-layer-by-layer enable measurements of electronic structure tuned by various parameters, such as epitaxial strain and surface termination, which have not been possible before with bulk materials. With the in situ connected scanning tunneling microscopy (STM), we are able to further resolve electronic properties of these films in spatial dimensions. In this talk, the newest results coming from this interconnected system will be presented.

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Presenters

  • Zhuoyu Chen

    • Stanford University
    • GLAM, Stanford University

Authors

  • Zhuoyu Chen

    • Stanford University
    • GLAM, Stanford University

  • Slavko Rebec

    • Stanford University
    • GLAM, Stanford University

  • Tao Jia

    • Stanford University
    • GLAM, Stanford University

  • Makoto Hashimoto

    • SLAC
    • SLAC national accelerator laboratory
    • SLAC National Accelerator Laboratory
    • Stanford University
    • SSRL, SLAC

  • Donghui Lu

    • SLAC National Accelerator Laboratory, Stanford University
    • SLAC national accelerator laboratory
    • SLAC
    • SSRL, SLAC
    • Stanford University
    • SLAC National Accelerator Laboratory

  • Zhixun Shen

    • Stanford University
    • SLAC National Accelerator Laboratory
    • SIMES, SLAC National Accelerator Lab
    • GLAM, Stanford University
    • Applied physics, Stanford University
    • Department of Applied Physics, Stanford University

  • Robert G Moore

    • Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory
    • SLAC
    • SIMES, SLAC