Direct Observation of the Wind Force in Aluminum Nanowires
ORAL
Abstract
Using recently developed techniques based on in situ mapping of valence electron energy loss spectra (EELS) in a transmission electron microscope (TEM), it is now possible to efficiently determine electron density changes in nanowires with parts-per-thousand precision. By mapping the bulk plasmon energy we quantify density changes throughout an aluminum wire with sub-10 nm spatial resolution, both while it carries electric current and after the current has been switched off. We observe changes in the wire density that are both even and odd in the sign of the applied current, which we attribute to thermal expansion and an electron wind force respectively. Our measurements are the first direct observation of the Blech effect, whereby strain in a current-carrying wire is induced to balance an applied force.
*This work was supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. The data presented were acquired at the Center for Electron Microscopy and M
–
Presenters
-
Matthew Mecklenburg
- CEMMA, Univ of Southern California
- Univ of Southern California
- University of Southern California
- Center for Electron Microscopy and Microanalysis, University of Southern California