Fourier Ptychographic Microscopy in the telecommunication wavelength using a femtosecond laser.

POSTER

Abstract

We report the succesful implementation of Fourier Ptychographic Microsopy (FPM) in the telecomunication wavelength using an ultrafast, low coherence laser. High resolution with reduced (near) speckle (free) images were obtained using the proposed approach. We also demostrate FPM can be used to image periodic structures through a silicon wafer.

Presenters

  • Ishtiaque Ahmed

    • Electrical Engineering, Texas Tech Univ

Authors

  • Ishtiaque Ahmed

    • Electrical Engineering, Texas Tech Univ

  • Maged Alotaibi

    • Electrical Engineering, Texas Tech Univ

  • Sueli Skinner-Ramos

    • Electrical Engineering, Texas Tech Univ

  • Daniel Dominiguez

    • Electrical Engineering, Texas Tech Univ

  • Ayrton Bernussi

    • Electrical Engineering, Texas Tech Univ

  • Luis Grave de Peralta

    • Electrical Engineering, Texas Tech Univ
    • Physics, Texas Tech University