Nanoscale Electrochemistry via Lithium Focused Ion Beam

ORAL

Abstract

We report progress in developing Li+ focused ion beams (FIB) as a novel probe for exploring nanoscale electrochemistry in battery-relevant materials. This work focuses on implantation of lithium ions in crystalline silicon to benchmark this technique and builds on recent, qualitative studies of FIB implantation in Sn microspheres [Takeuchi et al. JES 163 (6), A1010-A1012]. FIB implantation opens the possibility of precise spatial control of nanoscale lithium concentration though variation of the beam positioning and current. Experiments are performed in vacuo without the presence of electrolytes or associated solid-electrolyte interface. The Li+ ion beam operates with energies ranging from 0.5 to 5 keV, currents up to 15 pA, and minimum spot size of 27 nm using a magneto-optical trap ion source (MOTIS).

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Presenters

  • William McGehee

    • NIST -Natl Inst of Stds & Tech

Authors

  • William McGehee

    • NIST -Natl Inst of Stds & Tech

  • Evgheni Strelcov

    • NIST -Natl Inst of Stds & Tech

  • Jamie Gardner

    • NIST -Natl Inst of Stds & Tech

  • Saya Takeuchi

    • NIST -Natl Inst of Stds & Tech

  • Oleg Kirrilov

    • NIST -Natl Inst of Stds & Tech

  • Vladimir Oleshko

    • NIST -Natl Inst of Stds & Tech

  • David Gundlach

    • NIST -Natl Inst of Stds & Tech

  • Christopher Soles

    • Materials Science and Engineering Division, National Institute of Standards and Technology
    • NIST -Natl Inst of Stds & Tech
    • Materials Science & Engineering Division, National Institute of Standards & Technology
    • National Institute of Standards and Technology

  • Nikolai Zhitenev

    • Center for Nanoscale Science and Technology, NIST
    • Center for Nanoscale Science and Technology, NIST -Natl Inst of Stds & Tech
    • NIST -Natl Inst of Stds & Tech
    • Center for Nanoscale Science and Technology, National Institute of Standards and Technology

  • Jabez McClelland

    • NIST -Natl Inst of Stds & Tech