Probing the Dielectric Response of the Interfacial Buffer Layer in Epitaxial Graphene via Optical Spectroscopy

ORAL

Abstract

Monolayer epitaxial graphene (EG) is a suitable candidate for a variety of electronic applications. One advantage of EG growth on the Si face of SiC is that it develops as a single crystal, as does the layer below, referred to as the interfacial buffer layer (IBL), whose properties include an electronic band gap. Though various electrical and non-optical probing experiments have been conducted on this buffer layer, studies pertaining to its optical properties have not yet been rigorously explored. In this work, we combine measurements from Mueller matrix ellipsometry, differential reflectance contrast, atomic force microscopy, and Raman spectroscopy, as well as calculations from Kramers-Kronig analyses and density functional theory (DFT), to determine the dielectric function of the IBL within the energy range of 1 eV to 8.5 eV.

*NIST federal grant #70NANB12H185

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Presenters

  • Albert Rigosi

    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology
    • National Institute of Standards and Technology

Authors

  • Albert Rigosi

    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology
    • National Institute of Standards and Technology

  • Heather Hill

    • Engineering Physics, National Institute of Standards and Technology
    • National Institute of Standards and Technology
    • Physical Measurements Laboratory, National Institute of Standards and Technology
    • Physical Measurment Division, NIST
    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology

  • Sugata Chowdhury

    • Physical Measurment Division, NIST
    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology

  • Yanfei Yang

    • NIST
    • NIST - National Institute of Standards and Technology

  • Nhan Nguyen

    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology

  • Francesca Tavazza

    • Mechanical Measurment Division , NIST
    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology
    • Material Measurement Laboratory, National Institute of Standards and Technology

  • Randolph Elmquist

    • NIST -Natl Inst of Stds & Tech
    • NIST
    • NIST - National Institute of Standards and Technology

  • David Newell

    • NIST -Natl Inst of Stds & Tech
    • NIST - National Institute of Standards and Technology

  • Angela Hight Walker

    • Engineering Physics, National Institute of Standards and Technology
    • National Institute of Standards and Technology
    • NIST - Natl Inst of Stds & Tech
    • Physical Measurements Laboratory, National Institute of Standards and Technology
    • Physical Measurment Division, NIST
    • NIST -Natl Inst of Stds & Tech
    • Physical Measurement Laboratory, National Institute of Standards and Technology
    • NIST - National Institute of Standards and Technology
    • National Institute of Standards and Technology (NIST)
    • National Institute of Standards & Technology