Top-Contact Self-Aligned Printing for High-Performance Carbon Nanotube Thin-Film Transistors with Sub-Micron Channel Length

ORAL

Abstract


Semiconducting single-wall carbon nanotubes are ideal semiconductors for printed thin-film transistors due to their excellent electrical performance and intrinsic printability with solution-based deposition. However, limited by resolution and registration accuracy of current printing techniques, previously reported fully printed nanotube transistors had rather long channel lengths (>20 μm) and consequently low current-drive capabilities (<0.2 μA/μm). Here we report fully inkjet printed nanotube transistors with dramatically enhanced on-state current density of ∼4.5 μA/μm by downscaling the devices to a sub-micron channel length with top-contact self-aligned printing and employing high-capacitance ion gel as the gate dielectric. Also, the printed transistors exhibited a high on/off ratio of ∼105, low-voltage operation, and good mobility of ∼15.03 cm2 V−1s−1. These advantageous features of our printed transistors are very promising for future high-definition printed displays and sensing systems, low-power consumer electronics, and large-scale integration of printed electronics.

*We would like to acknowledge the collaboration of this research with King Abdul-Aziz City for Science and Technology (KACST) via The Center of Excellence for Nanotechnologies (CEGN).

Presenters

  • Fanqi Wu

    • Department of Materials Science, University of Southern California
    • Univ of Southern California

Authors

  • Fanqi Wu

    • Department of Materials Science, University of Southern California
    • Univ of Southern California
  • Xuan Cao

    • Univ of Southern California
    • Department of Materials Science, University of Southern California
    • Mork Family Department of Chemical Engineering and Materials Science, University of Southern California
  • Chongwu Zhou

    • Department of Electrical Engineering, University of Southern California
    • Ming Hsieh Department of Electrical Engineering, University of Southern California
    • Univ of Southern California
    • Mork Family Department of Chemical Engineering and Materials Science & Ming Hsieh Department of Electrical Engineering, University of Southern California