Resonant Soft X-ray Scattering studies with Transition Edge Sensors

ORAL

Abstract

Resonant Soft X-ray has been one of the key techniques to study charge orders in high Tc cuperates. To solve the issue of unwanted enhancement of inelastic florescence background at resonance, we have developed an energy-resolving superconducting Transition-Edge Sensor microcalorimeters. These superconducting sensors obtain exquisite energy resolution by exploiting the superconducting-to-normal transition to photon energy at cryogenic temperatures (∼ 70 mK) where thermal noise is minimal. This TES has demonstrated ∼ 1.5 eV resolution around Cu L3 edge (932.7 eV). We present first results of using this detector to study elastic diffuse scattering and charge orders from a single crystal of stripe-ordered La2-xBaxCuO4 (x=0.125). Use of this detector for studying excitations and models of rejecting fluorescence background will be further discussed.

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Presenters

  • Yizhi Fang

    • Univ of Illinois - Urbana

Authors

  • Yizhi Fang

    • Univ of Illinois - Urbana

  • Young Joe

    • NIST
    • National Institute of Standards and Technology

  • Sangjun Lee

    • Physics/MRL, Univ of Illinois - Urbana
    • Univ of Illinois - Urbana
    • Department of Physics, University of Illinois

  • Gilberto De La Pena

    • Physics/MRL, Univ of Illinois - Urbana
    • Univ of Illinois - Urbana
    • Department of Physics, University of Illinois

  • Xiaolan Sun

    • Univ of Illinois - Urbana

  • Fanny Rodolakis

    • Argonne National Laboratory

  • Jessica McChesney

    • Argonne National Laboratory

  • William Doriese

    • NIST
    • National Institute of Standards and Technology

  • Kelsey Morgan

    • National Institute of Standards and Technology

  • Joe Fowler

    • National Institute of Standards and Technology

  • Daniel Swetz

    • NIST
    • National Institute of Standards and Technology

  • Joel Ullom

    • National Institute of Standards and Technology

  • Peter Abbamonte

    • Univ of Illinois - Urbana