Structure and Properties Impacting Ferroelectricity in Sn<sub>2</sub>P<sub>2</sub>S<sub>6</sub>

ORAL

Abstract

Sn2P2S6 samples prepare under various conditions including chemical vapor transport and the Bridgman method exhibit marked variations in optical and dielectric properties. To understand the origin of these changes, detailed measurements of the thermal properties by specific heat methods are combined with structural measurements on multiple length scales. We link critical temperature-dependent structural changes with enhanced electronic properties.

*This work is funded by the USAF.

Presenters

  • Roger Lalancette

    • Rutgers University

Authors

  • Sizhan Liu

    • New Jersey Inst of Tech
    • Department of Physics, New Jersey Inst of Tech
  • Han Zhang

    • New Jersey Inst of Tech
    • Department of Physics, New Jersey Inst of Tech
  • Sanjit Ghose

    • Photon Science Division, Brookhaven National Laboratory
    • Brookhaven National Laboratory
  • Dean Evans

    • Air Force Research Laboratory, Wright-Patterson Air Force Base
    • Materials and Manufacturing Directorate, Air Force Research Laboratory
  • Roger Lalancette

    • Rutgers University
  • Trevor Tyson

    • New Jersey Inst of Tech
    • Department of Physics, New Jersey Inst of Tech