Characterizing and reducing microfabrication-induced loss in superconducting devices, Part II: Xmon qubits
ORAL
Abstract
Microfabrication-induced loss has previously been shown to limit the coherence times of both planar and 3-D superconducting qubits. Energy loss in these qubits arises from interactions with two-level state defects which are located in thin lossy surface dielectrics. More recently, we have identified a major source of this loss and then substantially improved this decoherence channel using a novel resonator structure for characterization and improvement. I will report on recent measurements of Xmon qubits with substantially improved coherence times due to our new fabrication process.
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