Fast Analysis of Time-Resolved Scattering Data
ORAL
Abstract
Organic Photovoltaics hold promise to reduce costs and increase efficiency. Most efforts have focused on spin-coating to fabricate high performance devices, a process that is not amenable to large scale fabrication. This mismatch in device fabrication processes makes it difficult to translate quantitative results obtained from laboratory scale devices to commercially prepared large area devices. Using a mini-slot die coater, designed and build in house, we address this issue, where the commercial process is translated to the laboratory setting. Grazing Incidence Small Angle X-ray Scattering was used to probe the change in morphology during the printing process. HIPGISAXS was used to fit the data in real-time by utilizing different ASCR facilities. SPOT orchestrated the workflow for the data: the transfer from the beamline to NERSC and subsequently to the TITAN supercomputer for fitting and back to NERSC.
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