Circular photocurrent response of a topological insulator thin film probed by scanning photocurrent microscopy

The remarkable nature of surface states in topological insulators is expected to have a unique photocurrent response to electromagnetic radiation. However, the surface and bulk photo-excited charge transport mechanisms, in relation to the band bending at the electrode-topological insulator interface, have not been well understood. Here, we present scanning photocurrent microscopy measurements on a gated topological insulator microdevice and show that the spin-polarized photocurrent displays direction reversal near the electrical contact interfaces. We discuss two possible mechanisms, which alternatively play dominant roles in the helicity-dependent photocurrent map. Our analysis determines the magnitude of each contribution, and reveals the governing process under different gate conditions.