Approach to universal self-similar attractor for the levelling of thin liquid films
ORAL
Abstract
We compare the capillary levelling of a random surface perturbation on a thin polystyrene film with a theoretical study on the two-dimensional capillary-driven thin film equation. Using atomic force microscopy, we follow the time evolution of samples prepared with different initial perturbations of the free surface. In particular, we show that the surface profiles present long term self-similarity, and furthermore, that they converge to a universal self-similar attractor that only depends on the volume of the perturbation, consistent with the theory. Finally, we look at the convergence time for the different samples and find very good agreement with the analytical predictions.
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Authors
Elie Rapha\"el
PCT Lab, UMR CNRS 7083 Gulliver, ESPCI ParisTech, PSL Research University, Paris, France
UMR CNRS 7083 Gulliver, ESPCI ParisTech, PSL Research University
UMR CNRS 7083 Gulliver, ESPCI ParisTech
Michael Benzaquen
UMR CNRS 7083 Gulliver, ESPCI ParisTech, PSL Research University
UMR CNRS 7083 Gulliver, ESPCI ParisTech
Paul Fowler
Department of Physics and Astronomy and the Brockhouse Institute for Materials Research, McMaster University, Hamilton, Canada
Laetitia Jubin
Department of Physics \& Astronomy and the Brockhouse Institute for Materials Research, McMaster University, Hamilton, Canada
Thomas Salez
UMR CNRS 7083 Gulliver, ESPCI ParisTech, PSL Research University
PCT Lab, UMR CNRS 7083 Gulliver, ESPCI ParisTech, PSL Research University, Paris, France
Kari Dalnoki-Veress
Department of Physics and Astronomy and the Brockhouse Institute for Materials Research, McMaster University, Hamilton, Canada