Focus Session: Advances in Scanned Probe Microscopy II: High Frequencies and Optical Techniques

Presentations

• Measurement of Radiation Pressure in an Ambient Environment

  ORAL

  March 3, 2015, 8:00 AM – March 3, 2015, 8:12 AM

  Authors

  • Dakang Ma

    • University of Maryland - College Park

  • Joseph Garrett

    • University of Maryland - College Park

  • Jeremy Munday

    • University of Maryland - College Park

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• Sensitivity Improvement and Cryogenic Application of Scanning Microwave Microscope

  ORAL

  March 3, 2015, 8:12 AM – March 3, 2015, 8:24 AM

  Authors

  • Hideyuki Takahashi

    • Department of Basic Science, the University of Tokyo
    • Department of Basic Science, University of Tokyo

  • Yoshinori Imai

    • Department of Basic Science, the University of Tokyo
    • Department of Basic Science, University of Tokyo

  • Atsutaka Maeda

    • Department of Basic Science, the University of Tokyo
    • Department of Basic Science, University of Tokyo

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• Subsurface Imaging with the Scanning Microwave Microscope

  ORAL

  March 3, 2015, 8:24 AM – March 3, 2015, 8:36 AM

  Authors

  • Joseph Kopanski

    • Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology

  • Lin You

    • Semiconductor and Dimensional Metrology Div, NIST, Gaithersburg, MD
    • Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology

  • Jonathan Michelson

    • Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology

  • Emily Hitz

    • Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology

  • Yaw Obeng

    • Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology

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• Advances in imaging and quantification of electrical properties at the nanoscale using Scanning Microwave Impedance Microscopy (sMIM)

  ORAL

  March 3, 2015, 8:36 AM – March 3, 2015, 8:48 AM

  Authors

  • Stuart Friedman

    • Primenano, Inc

  • Yongliang Yang

    • Primenano, Inc

  • Oskar Amster

    • Primenano, Inc

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• Analytical quantitative theory of RF-SPM for nanocarbon electronics

  ORAL

  March 3, 2015, 8:48 AM – March 3, 2015, 9:00 AM

  Authors

  • Slava V. Rotkin

    • Lehigh University
    • Lehigh University, Department of Physics and Center for Advanced Materials and Nanotechnology

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• Ferromagnetic Resonance detection using stroboscopic magneto optical Kerr effect

  ORAL

  March 3, 2015, 9:00 AM – March 3, 2015, 9:12 AM

  Authors

  • Seungha Yoon

    • NIST - Natl Inst of Stds \& Tech, and University of Maryland

  • Takahiro Moriyama

    • NIST - Natl Inst of Stds \& Tech, and Kyoto University

  • Robert McMichael

    • National Institute of Standards and Technology
    • Center for Nanoscale Science and Technology, National Institute of Standards and Technology
    • NIST - Natl Inst of Stds \& Tech

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• Time-resolved scanning tunneling microscopy for studies of nanoscale magnetization dynamics

  COFFEE_KLATCH · Invited

  March 3, 2015, 9:12 AM – March 3, 2015, 9:48 AM

  Authors

  • Sebastian Loth

    • 1. Max Planck Institute for the Structure and Dynamics of Matter, 22761 Hamburg; 2. Max Planck Institute for Solid State Research, 70569 Stuttgart
    • Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, Germany

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• A low temperature ultrahigh vacuum scanning tunneling microscope with high-NA optics to probe optical interactions at the atomic scale

  ORAL

  March 3, 2015, 9:48 AM – March 3, 2015, 10:00 AM

  Authors

  • Haigang Zhang

    • Argonne National Laboratory, Argonne, IL 60439

  • Joseph Smerdon

    • University of Central Lancashire, Lancashire, UK

  • Ozgun Suzer

    • HGST, a Western Digital Company, San Jose, CA 95135

  • Heath Kersell

    • Ohio University, Athens, OH 45701

  • Jeffrey Guest

    • Argonne National Laboratory, Argonne, IL 60439

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• Metal-Insulator Phase transition of VO$_2$ nano crystals studied by near-field nanoscopy

  ORAL

  March 3, 2015, 10:00 AM – March 3, 2015, 10:12 AM

  Authors

  • Yohannes Abate

    • Georgia State University

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• Determination of the dielectric function of materials with scattering-type scanning near field optical microscopy

  ORAL

  March 3, 2015, 10:12 AM – March 3, 2015, 10:24 AM

  Authors

  • Peng Xu

    • College of William and Mary

  • T.J. Huffman

    • College of William and Mary

  • M.M. Qazilbash

    • College of William and Mary

  • Inhae Kwak

    • University of Florida

  • Amlan Biswas

    • University of Florida

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• Generalized method of eigenoscillations for near-field optical microscopy

  ORAL

  March 3, 2015, 10:24 AM – March 3, 2015, 10:36 AM

  Authors

  • Bor-Yuan Jiang

    • Univ of California - San Diego

  • Lingfeng Zhang

    • Boston University

  • Antonio Castro Neto

    • National University of Singapore

  • Dimitri Basov

    • Univ of California - San Diego

  • Michael Fogler

    • Univ of California - San Diego

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• Cryogenic Near-Field Microscopy in Correlated Electronic Systems

  ORAL

  March 3, 2015, 10:36 AM – March 3, 2015, 10:48 AM

  Authors

  • Adrian Gozar

    • Brookhaven National Laboratory

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• Radiation pressure excitation of Low Temperature Atomic Force {\&} Magnetic Force Microscope (LT-AFM/MFM) for Imaging

  ORAL

  March 3, 2015, 10:48 AM – March 3, 2015, 11:00 AM

  Authors

  • Ozgur Karci

    • NanoMagnetics Instruments Ltd.

  • Umit Celik

    • NanoMagnetics Instruments Ltd.
    • NanoMagnetics Instruments Ltd., Ankara, Turkey

  • Ahmet Oral

    • Middle East Tech Univ
    • Department of Physics, Middle East Technical University, Ankara Turkey 06800

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