Local Gating of Carbon Nanotube inside TEM

ORAL

Abstract

We report a new method of fabricating ultra-clean and hysteresis-free multi-wall carbon nanotube field-effect transistor (CNFET) inside an ultra-high vacuum transmission electron microscopy (TEM) equipped with a movable Au tip as a local gate. Local gating of CNFET is demonstrated concurrently with atomic-scale imaging. The development of the ambipolar characteristic of CNFET, the Vds effect on CNFET as well as the localized characteristics of CNFET have been investigated.

Authors

  • Li-Ying Chen

    • None
  • Yen-Song Chen

    • None
  • Chia-Seng Chang

    • None