Temperature Dependent Raman Studies on Liquid Phase Exfoliated MoS2

We investigate on the temperature dependence of in-plane E12g and out-of-plane A1g Raman modes of few-layer MoS2 prepared using the liquid-phase exfoliation method. Structural characterization performed after exfoliation using transmission electron microscopy (TEM) indicate the resultant material contains small, submicron size, few-layer flakes. Raman measurements indicating material thickness of 6 layers or fewer were observed at room temperature using a 532 nm laser line (E12g$=$381.4 cm-1 and A1g$=$405.8 cm-1). The Raman peak shifts indicate a linear dependence on temperature within the range 293 K to 77 K. The measured temperature coefficients of E12g and A1g modes will be presented and compared with other similar experimental/theoretical data available.