A Scanning Tunneling Study of Twisted Bilayer Graphene

ORAL

Abstract

The properties of bilayer graphene strongly depend on the angle of rotation between its two layers. We investigated the local electronic structure of twisted bilayer graphene on an insulating substrate. Using scanning tunneling microscopy, we measured the energy dependence of features in the differential tunneling conductance for many different twist angles. Comparison with theoretical calculations reveal the physical origin of these features.

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Authors

  • Dillon Wong

    • Univ of California - Berkeley
    • University of Carlifornia at Berkeley

  • Yang Wang

    • Univ of California - Berkeley

  • Jeil Jung

    • University of Texas at Austin

  • Ashley DaSilva

    • University of Texas at Austin

  • Sergio Pezzini

    • Univ of California - Berkeley

  • Hsin-zon Tsai

    • Univ of California - Berkeley

  • Han Sae Jung

    • Univ of California - Berkeley

  • Ramin Khajeh

    • Univ of California - Berkeley

  • Youngkyou Kim

    • Univ of California - Berkeley

  • Salman Kahn

    • Univ of California - Berkeley

  • Sajjad Tollabimazraehno

    • Univ of California - Berkeley

  • Haider Rasool

    • Univ of California - Berkeley

  • Juwon Lee

    • Univ of California - Berkeley

  • Kenji Watanabe

    • National Institute for Materials Science

  • Takashi Taniguchi

    • National Institute for Materials Science

  • Alex Zettl

    • Univ of California - Berkeley

  • Shaffique Adam

    • Yale-NUS College

  • Allan MacDonald

    • University of Texas at Austin

  • Michael Crommie

    • Univ of California - Berkeley