Characterizing measurement and feedback processes in superconducting qubit systems
ORAL
Abstract
New strategies for quantum control have been enabled by integrating nearly quantum-limited amplifiers with long-lived superconducting qubits. We now record high fidelity~single shot measurements that are also QND. We rely on these properties of our measurement to apply an active feedback on a quantum system. Understanding the degree to which they are QND is desirable. For example, if measurements are perfectly QND yet have finite fidelity, repeated measurements can improve the overall fidelity. In this talk, we present a formalism to quantify a number of important independent measurement parameters including fidelity and the QND degree. We then apply this formalism to characterize and optimize a feedback experiment.
*Work supported by ARO and IARPA
–
Authors
N. Ofek
Departments of Applied Physics and Physics, Yale University
Y. Liu
Department of Applied Physics, Yale University
Departments of Applied Physics and Physics, Yale University
Michael Hatridge
Departments of Applied Physics and Physics, Yale University
Applied Physics Department, Yale University
Yale Univ. Depts. of Applied Physics and Physics
S. Shankar
Department of Applied Physics, Yale University
Departments of Applied Physics and Physics, Yale University
Michel Devoret
Department of Applied Physics, Yale University
Departments of Applied Physics and Physics, Yale University
Yale Univ. Depts. of Applied Physics and Physics
Robert Schoelkopf
Departments of Applied Physics and Physics, Yale University
Department of Applied Physics, Yale University
Yale University Departments of Applied Physics and Physics
