Focus Session: Advances in Scanned Probe Microscopy 1: Scanning Probe Spectroscopy & Novel Applications to C-based Systems

Presentations

• A Josephson STM with two niobium tips

  ORAL

  March 21, 2013, 8:00 AM – March 21, 2013, 8:12 AM

  Authors

  • Anita Roychowdhury

    • Laboratory for Physical Sciences, University of Maryland, College Park

  • Rami Dana

    • Laboratory for Physical Sciences, University of Maryland, College Park
    • University of Maryland

  • Michael Dreyer

    • Laboratory for Physical Sciences, University of Maryland, College Park

  • James Anderson

    • University of Maryland, College Park
    • University of Maryland
    • University of Maryland, College Park, Maryland

  • C.J. Lobb

    • University of Maryland, College Park
    • University of Maryland

  • F.C. Wellstood

    • University of Maryland, College Park
    • University of Maryland

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• Electron-Hole Asymmetries in the Locally Inverted $\alpha^2 F(\omega)$ Spectrum of a Conventional Superconductor by STM

  ORAL

  March 21, 2013, 8:12 AM – March 21, 2013, 8:24 AM

  Authors

  • Francis Niestemski

    • Stanford University / SLAC

  • Steven Johnston

    • UBC

  • Alex Contryman

    • Stanford University / SLAC

  • Charlie Camp

    • Stanford University / SLAC

  • Tom Devereaux

    • Stanford University / SLAC

  • Hari Manoharan

    • Stanford University / SLAC

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• Intermodulation Spectroscopy applied to AFM

  ORAL

  March 21, 2013, 8:24 AM – March 21, 2013, 8:36 AM

  Authors

  • David B. Haviland

    • Royal Institute of Technology (KTH), Stockholm, Sweden
    • The Royal Institute of Technology (KTH)

  • Daniel Platz

    • Royal Institute of Technology (KTH), Stockholm, Sweden
    • The Royal Institute of Technology (KTH)

  • Daniel Forchheimer

    • Royal Institute of Technology (KTH), Stockholm, Sweden
    • The Royal Institute of Technology (KTH)

  • Erik Thol\'en

    • Intermodulation Products AB

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• Interaction imaging with amplitude-dependence force spectroscopy

  ORAL

  March 21, 2013, 8:36 AM – March 21, 2013, 8:48 AM

  Authors

  • Daniel Platz

    • Royal Institute of Technology (KTH), Stockholm, Sweden
    • The Royal Institute of Technology (KTH)

  • Daniel Forchheimer

    • Royal Institute of Technology (KTH), Stockholm, Sweden
    • The Royal Institute of Technology (KTH)

  • Erik Thol\'{e}n

    • Intermodulation Products AB, Solna, Sweden

  • David B. Haviland

    • Royal Institute of Technology (KTH), Stockholm, Sweden
    • The Royal Institute of Technology (KTH)

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• Quantitative Atomic-Resolution Surface Force Field Spectroscopy in Three Dimensions: A {\it {How-To}} Guide for Collecting Meaningful Data

  ORAL

  March 21, 2013, 8:48 AM – March 21, 2013, 9:00 AM

  Authors

  • Mehmet Z. Baykara

    • Bilkent University

  • Omur E. Dagdeviren

    • Yale University

  • Todd C. Schwendemann

    • Southern Connecticut State University

  • Harry M\"{o}nig

    • Westfaelische Wilhelms-Universitaet Muenster

  • Eric I. Altman

    • Yale University

  • Udo D. Schwarz

    • Yale University

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• Virtual Scanning Tunneling Microscopy: A local spectroscopic probe of high mobility 2D electron systems

  ORAL

  March 21, 2013, 9:00 AM – March 21, 2013, 9:12 AM

  Authors

  • Matthew Pelliccione

    • Stanford University

  • John Bartel

    • Stanford University

  • Adam Sciambi

    • Stanford University

  • Loren Pfeiffer

    • Princeton University

  • Ken West

    • Princeton University

  • David Goldhaber-Gordon

    • Stanford University
    • Department of Physics, Stanford University, Stanford, CA, 94305, USA

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• Tuning 2D-2D tunneling in high mobility electron systems

  ORAL

  March 21, 2013, 9:12 AM – March 21, 2013, 9:24 AM

  Authors

  • John Bartel

    • Stanford University

  • Matthew Pelliccione

    • Stanford University

  • Adam Sciambi

    • Stanford University

  • Loren Pfeiffer

    • Princeton University

  • Ken West

    • Princeton University

  • David Goldhaber-Gordon

    • Stanford University
    • Department of Physics, Stanford University, Stanford, CA, 94305, USA

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• Gate Map Tunneling Spectroscopy of Interactions in Graphene

  COFFEE_KLATCH · Invited

  March 21, 2013, 9:24 AM – March 21, 2013, 10:00 AM

  Authors

  • Jungseok Chae

    • Center for Nanoscale Science and Technology, NIST and Maryland NanoCenter, University of Maryland

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• Thermoelectric microscopy for imaging disorder in epitaxial graphene

  ORAL

  March 21, 2013, 10:00 AM – March 21, 2013, 10:12 AM

  Authors

  • Sanghee Cho

    • Korea Research Institute of Standards and Science

  • Stephen Kang

    • Korea Research Institute of Standards and Science

  • Wondong Kim

    • Korea Research Institute of Standards and Science

  • Ho-Ki Lyeo

    • Korea Research Institute of Standards and Science

  • Eui-Sup Lee

    • Korea Advanced Institute of Science and Technology

  • Sung-Jae Woo

    • Korea Advanced Institute of Science and Technology

  • Yong-Hyun Kim

    • Korea Advanced Institute of Science and Technology

  • Ki-Jeong Kong

    • Korea Research Institute of Chemical Technology

  • Ilyou Kim

    • Pohang University of Science and Technology

  • Hyeong-Do Kim

    • Pohang University of Science and Technology

  • Tong Zhang

    • National Institute of Standards and Technology

  • Joseph Stroscio

    • National Institute of Standards and Technology

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• Noise Analysis on Graphene Devices via Scanning Noise Microscopy

  ORAL

  March 21, 2013, 10:12 AM – March 21, 2013, 10:24 AM

  Authors

  • Duckhyung Cho

    • Department of Physics, Seoul Nat Univ

  • Moon Gyu Sung

    • Seoul National University

  • Hyungwoo Lee

    • Seoul National University

  • Kwang Heo

    • Seoul National University

  • Kyung-Eun Byun

    • Seoul National University

  • Taekyeong Kim

    • Seoul National University

  • David H. Seo

    • Seoul National University

  • Sunae Seo

    • Seoul National University

  • Seunghun Hong

    • Seoul National University

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• Electronic state of carbon material surface by non-contact scanning nonlinear dielectric microscopy

  ORAL

  March 21, 2013, 10:24 AM – March 21, 2013, 10:36 AM

  Authors

  • Shin-ichiro Kobayashi

    • Research Institute of Electrical Communication, Tohoku University
    • School of Engineering, Tohoku University

  • Yasuo Cho

    • Research Institute of Electrical Communication, Tohoku University

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• Contactless Probing of the Carrier Transport in Carbon Nanotubes Using Dielectric Force Microscopy

  ORAL

  March 21, 2013, 10:36 AM – March 21, 2013, 10:48 AM

  Authors

  • Yize Li

    • Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences

  • Jun Ge

    • Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences

  • Jia Liu

    • Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences

  • Jie Zhang

    • Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences

  • Wei Lu

    • Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences

  • Liwei Chen

    • Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences

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• Quantitative Kelvin Probe Force Microscopy of a Single-Walled Carbon Nanotube Transistor

  ORAL

  March 21, 2013, 10:48 AM – March 21, 2013, 11:00 AM

  Authors

  • Elliot J. Fuller

    • University of California at Irvine
    • University of California Irvine

  • Brad Corso

    • University of California at Irvine

  • Tolga Gul

    • University of California at Irvine

  • Philip Collins

    • University of California at Irvine

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