Temperature Dependence of the Raman Spectra of CVD-grown Monolayer MoS$_2$

ORAL

Abstract

We investigated the temperature dependence of the E$^{1}_{\mathrm{2g}}$ and A$_{\mathrm{1g}}$ peaks in the Raman spectra of monolayer MoS$_{2}$ grown by chemical vapor deposition (CVD) on Si/SiO$_{2}$ substrates. Micro-Raman spectroscopy was carried out using the 532 nm laser excitation over the temperature range from 30 to 175 $^{\circ}$C. The extracted values of the temperature coefficient of these modes are $\chi =$ -0.013 cm$^{-1}$/$^{\circ}$C and $\chi =$ -0.016 cm$^{-1}$/$^{\circ}$C, respectively. The obtained results may shed light on the anomalous behavior of these modes observed in laser power dependent studies of monolayer MoS$_{2}$.

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Authors

  • A. Glen Birdwell

    • U.S. Army Research Laboratory, Sensors and Electron Devices Directorate, 2800 Powder Mill Rd, Adelphi, MD 20783, USA

  • Frank J. Crowne

    • U.S. Army Research Laboratory, Sensors and Electron Devices Directorate, 2800 Powder Mill Rd, Adelphi, MD 20783, USA

  • Terrance P. O'Regan

    • U.S. Army Research Laboratory, Sensors and Electron Devices Directorate, 2800 Powder Mill Rd, Adelphi, MD 20783, USA

  • Pankaj B. Shah

    • U.S. Army Research Laboratory, Sensors and Electron Devices Directorate, 2800 Powder Mill Rd, Adelphi, MD 20783, USA

  • Madan Dubey

    • U.S. Army Research Laboratory, Sensors and Electron Devices Directorate, 2800 Powder Mill Rd, Adelphi, MD 20783, USA

  • Sina Najmaei

    • Department of Mechanical Engineering and Materials Science, Rice University, Houston, TX 77005, USA

  • Zheng Liu

    • Department of Mechanical Engineering and Materials Science, Rice University, Houston, TX 77005, USA

  • Pulickel M. Ajayan

    • Rice University
    • Department of Mechanical Engineering and Materials Science, Rice University, Houston, TX 77005, USA

  • Jun Lou

    • Department of Mechanical Engineering and Materials Science, Rice University, Houston, TX 77005, USA

  • Rusen Yan

    • Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA
    • National Institute of Standards and Technology, Physical Measurement Laboratory, Gaithersburg, Maryland, USA
    • NIST; University of Notre Dame

  • Huili Grace Xing

    • Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA