Invited Session: Frontiers in Nanomanufacturing: Atomic Scale Metrology, Large Scale Industry Technology Challegnes and Inherent Device Limitations

Presentations

• Time-Resolved, Atomic-Resolution Imaging of Metastable Atom Configurations

  COFFEE_KLATCH · Invited

  March 19, 2013, 11:15 AM – March 19, 2013, 11:51 AM

  Authors

  • Christian Kisielowski

    • Lawrence Berkeley National Laboratory, Berkeley CA 94720

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• TBD

  COFFEE_KLATCH · Invited

  March 19, 2013, 11:51 AM – March 19, 2013, 12:27 PM

  Authors

  • Thomas Albrecht

    • HGST, San Jose Research Center

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• Scalable fabrication of nanostructured devices on flexible substrates using additive driven self-assembly and nanoimprint lithography

  COFFEE_KLATCH · Invited

  March 19, 2013, 12:27 PM – March 19, 2013, 1:03 PM

  Authors

  • James Watkins

    • Polymer Science and Engineering Department at University of Massachusetts Amherst
    • Department of Polymer Science and Engineering, University of Massachusetts Amherst
    • University of Massachusetts Amherst
    • University of Massachusetts

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• to be determined

  COFFEE_KLATCH · Invited

  March 19, 2013, 1:03 PM – March 19, 2013, 1:39 PM

  Authors

  • Asen Asenov

    • University of Glasgow

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• Imagining and Imaging Future Devices: A Physicist's Dream

  COFFEE_KLATCH · Invited

  March 19, 2013, 1:39 PM – March 19, 2013, 2:15 PM

  Authors

  • Scott List

    • Intel Corporation

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