Noise from Two-Level Systems in Superconducting Resonators

Two-level systems (TLSs) present in amorphous dielectrics and surface interfaces are a significant source of decoherence in superconducting qubits. Linear microwave resonators offer a valuable instrument for characterizing the strongly power-dependent response of these TLSs. Using quarter-wavelength coplanar waveguide resonators, we monitored the microwave response of the resonator at a single near-resonant frequency versus time at varying microwave drive powers. We observe a time dependent variation of the resonator's internal dissipation and resonance frequency. The amplitude of these variations saturates with power in a manner similar to loss from TLSs. These results provide a means for quantifying the number and distribution of TLSs.