X-ray nanotomography study of insulator-coated tips with sub-micron conducting apex for the combination of scanning probe microscopy and synchrotron radiation

ORAL

Abstract

Hard X-ray nanotomography provides an important three-dimensional view of insulator-coated ``smart tips'' that can be utilized for modern emerging scanning probe techniques. Tips, entirely coated by an insulating SiO2 film except at the very tip apex, are fabricated by means of electron beam physical vapor deposition, focused ion beam milling and ion beam-stimulated oxide growth. Although x-ray tomography studies confirm the structural integrity of the oxide film, transport measurements suggest the presence of defect-induced states in the SiO2 film [1]. The development of insulator-coated tips can facilitate nanoscale analysis with electronic, chemical, and magnetic contrast by synchrotron-based scanning probe microscopy. \\[4pt] [1] Rose at al., Appl. Phys. Lett. 99, 173102 (2011).

*Work at the Advanced Photon Source, the Center for Nanoscale Materials, and the Electron Microscopy Center was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract DE-AC02-06CH11357.

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Authors

  • Volker Rose

    • Argonne National Laboratory

  • TeYu Chien

    • Northwestern University
    • Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208

  • J.W. Freeland

    • Argonne National Laboratory
    • Advanced Photon Source, Argonne National Laboratory

  • Daniel Rosenmann

    • Argonne National Laboratory
    • Center for Nanoscale Materials, Argonne National Laboratory

  • Robert Winarski

    • Argonne National Laboratory