Landau quantization and the thickness limit of topological insulator thin films of Sb$_{2}$Te$_{3}$

ORAL

Abstract

We report the experimental observation of Landau quantization of molecular beam epitaxy grown Sb$_{2}$Te$_{3}$ thin films by a low-temperature scanning tunneling microscope. Different from all the reported systems, the Landau quantization in Sb$_{2}$Te$_{3}$ topological insulator is not sensitive to the intrinsic substitutional defects in the films. As a result, a nearly perfect linear energy dispersion of surface states as 2D massless Dirac fermion system is observed. We demonstrate that 4 quintuple layers are the thickness limit for Sb$_{2}$Te$_{3}$ thin film being a 3D topological insulator.

Authors

  • Xucun Ma

    • Institue of Physics, CAS
  • Yepeing Jiang

    • Institue of Physics, CAS
  • Yilin Wang

    • Institue of Physics, CAS
  • Mu Chen

    • Department of Physics, Tsinghua University
  • Canli Song

    • Institue of Physics, CAS
  • Zhi Li

    • Institue of Physics, CAS
  • Lili Wang

    • Institue of Physics, CAS
  • Ke He

    • Institue of Physics, CAS
  • Xi Chen

    • Department of Physics, Tsinghua University
  • Qi-Kun Xue

    • Department of Physics, Tsinghua University