Local nanoscale frictional variations of graphene investigated with lateral force microscopy

ORAL

Abstract

Lateral force microscopy is used to investigate the local nanoscale frictional variations on single- and multi-layered graphene films. Employing novel calibration methods, quantitative frictional measurements are taken for a range of normal loads. The coverage of specific high-friction regions with a single layer of graphene shows a significant reduction in the frictional characteristics.

*Supported in part by the Kentucky NSF EPSCoR program through award EPS-0814194 and the University of Kentucky Center for Advanced Materials.

Authors

  • D. Patrick Hunley

    • University of Kentucky
  • Tyler Flynn

    • University of Kentucky
  • Tom Dodson

    • University of Kentucky
  • Abhishek Sundararajan

    • University of Kentucky
  • Douglas. R Strachan

    • University of Kentucky