Thin Film Growth and Processing

ORAL · W5 ·

Presentations

  • ORAL

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    Authors

    • Martin Sandberg

      • National institute of Standards and Technology, Boulder, CO 80305
      • National Institute of Standards and Technology

    • Michael Vissers

      • National institute of Standards and Technology, Boulder, CO 80305

    • Jeff Kline

      • National institute of Standards and Technology, Boulder, CO 80305

    • Martin Weides

      • National institute of Standards and Technology, Boulder, CO 80305

    • Jiansong Gao

      • National institute of Standards and Technology, Boulder, CO 80305

    • David Wisebey

      • Saint Louis University, St. Louis, Missouri 63103

    • David Pappas

      • National institute of Standards and Technology, Boulder, CO 80305

    View abstract →

  • ORAL

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    Authors

    • Amy Marquardt

      • Department of Materials Science and Engineering, University of Maryland, College Park, MD, 20742

    • Eric Breitung

      • Library of Congress, Washington D.C.

    • Terry Drayman-Weisser

      • Walters Art Museum, Baltimore, MD

    • Glenn Gates

      • Walters Art Museum, Baltimore, MD

    • Gary W. Rubloff

      • Department of Materials Science and Engineering, University of Maryland, College Park, MD, 20742

    • Ray Phaneuf

      • Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742
      • Department of Materials Science and Engineering, University of Maryland, College Park, MD, 20742
      • University of Maryland

    View abstract →

  • ORAL

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    Authors

    • Andre Avelino Pasa

      • Laboratorio de Filmes Finos e Superficies, Departamento de Fisica, Universidade Federal de Santa Catarina, 88.040-900 Florianopolis, SC, Brazil
      • Laborat\'orio de Filmes Finos e Superf\'icies, Universidade Federal de Santa Catarina
      • Laboratorio de Filmes finos e Superficies (LFFS), Universidade Federal de Santa catarina

    • Marilia Alamini

      • Laboratorio de Filmes Finos e Superficies, Departamento de Fisica, Universidade Federal de Santa Catarina, 88.040-900 Florianopolis, SC, Brazil

    • Rene da Silva

      • Laboratorio de Filmes Finos e Superficies, Departamento de Fisica, Universidade Federal de Santa Catarina, 88.040-900 Florianopolis, SC, Brazil

    • Vinicius Zoldan

      • Laboratorio de Filmes Finos e Superficies, Departamento de Fisica, Universidade Federal de Santa Catarina, 88.040-900 Florianopolis, SC, Brazil

    • Eduardo Isoppo

      • Laboratorio de Filmes Finos e Superficies, Departamento de Fisica, Universidade Federal de Santa Catarina, 88.040-900 Florianopolis, SC, Brazil

    • Ubirajara Rodrigues-Filho

      • Instituto de Quimica de Sao Carlos, USP, 13.564-970 Sao Carlos, SP, Brazil

    • Fabio Aarao Reis

      • Instituto de Fisica, Universidade Federal Fluminense, Av. Litoranea s/n, Niteroi, RJ, 24210-340, Brazil

    • Aloisio Klein

      • Laboratorio de Materiais, UFSC, C.P. 476, Florianopolis, SC, Brazil.

    View abstract →

  • ORAL

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    Authors

    • Michael Pierce

      • Rochester Institute of Technology
      • Department of Physics, Rochester Institute of Technology

    • Daniel Hennessy

      • Materials Science Division, Argonne National Laboratory

    • Kee-Chul Chang

      • Materials Science Division, Argonne National Laboratory

    • Vladimir Komanicky

      • Safarik University
      • Faculty of Science, Safarik University

    • Joseph Strzalka

      • Argonne National Laboratory
      • Advanced Photon Source, Argonne National Laboratory

    • Alec Sandy

      • Advanced Photon Source, Argonne National Laboratory

    • Andi Barbour

      • Materials Science Division, Argonne National Laboratory

    • Hoydoo You

      • Materials Science Division, Argonne National Laboratory

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  • ORAL

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    Authors

    • Oleg Trushin

      • Yaroslavl Branch of the Institute of Physics and Technology of RAS, Yaroslav, Russia

    • Maral Aminpour

      • Physics Department, University of Central Florida
      • Department of Physics, University of Central Florida

    • Talat S. Rahman

      • Physics Department and NSTC, University of Central Florida
      • Physics Department, University of Central Florida
      • Department of Physics and NSTC, University of Central Florida, Orlando, Fl 32816

    View abstract →

  • ORAL

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    Authors

    • Yu-Ning Wu

      • Department of Physics and Quantum Theory Project, University of Florida, USA

    • Hai-Ping Cheng

      • Dept. of Physics and QTP, University of Florida, USA
      • Department of Physics and Quantum Theory Project, University of Florida, USA

    • Nouari Keba\"Ili

      • Laboratoire Aim\'e Cotton, CNRS-Universit\'e Paris Sud 11, France

    • Albert Masson

      • Laboratoire Aim\'e Cotton, CNRS-Universit\'e Paris Sud 11, France

    • Catherine Br\'echignac

      • Laboratoire Aim\'e Cotton, CNRS-Universit\'e Paris Sud 11, France

    View abstract →

  • ORAL

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    Authors

    • A. Matsubayashi

      • College of Nanoscale Science and Engineering, University at Albany, State University of New York

    • J. Abel

      • College of Nanoscale Science and Engineering, University at Albany, State University of New York

    • D.P. Sinha

      • College of Nanoscale Science and Engineering, University at Albany, State University of New York

    • J.U. Lee

      • College of Nanoscale Science and Engineering, University at Albany, State University of New York

    • V.P. LaBella

      • College of Nanoscale Science and Engineering, University at Albany, State University of New York

    View abstract →