Ellipsometric study of SrTiO$_{3}$ thin film grown Si(100)

ORAL

Abstract

Recently, a new method to grow SrTiO$_{3}$ thin ferroelectric film directly on Si(100) has been demonstrated by \textit{M. P. Warusawithana, et al}. We use ellipsometry to study the film and a model based on inhomogenous gap to oxide deficiency was made to interpret the data.

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Authors

  • Yao Tian

    • University of Toronto

  • Carolina Adamo

    • Cornell Center of Materials Research
    • Laboratory of Atomic and Solid State Physics, Department of Physics, Cornell University, Ithaca, NY 14853, USA

  • Kenneth Burch

    • University of Toronto
    • Department of Physics and Institute of Optical Sciences, U. of Toronto