Transport Characteristics of Self-Aligned Josephson Junctions Grown using co-Deposited Molecular Beam Epitaxy

ORAL

Abstract

Low noise Josephson junctions are extremely desirable in SQUIDs and qubit circuits. Sources of flux noise and critical current noise can be reduced by using both clean, single crystal junctions to lower the density of fluctuators and by decreasing the size of the junctions to lower the absolute number of fluctuators. We report transport characteristics of small, single crystal Josephson junctions grown using a co-deposited aluminum-oxide barrier molecular beam epitaxy process. We also report a novel self-aligned fabrication process that allows us to produce sub-micron junctions from these single crystal films. We show that our co-deposited junctions have more ideal transport characteristics than those junctions grown with only a diffused barrier. -

*Work supported by IARPA grant Army UCB-00006692

Authors

  • Gustaf Olson

    • University of Illinois Urbana Champaign
  • Allison Dove

    • University of Illinois Urbana Champaign
  • Zachary Yoscovits

    • University of Illinois Urbana Champaign
  • Christopher Nugroho

    • University of Illinois at Urbana-Champaign
    • University of Illinois Urbana Champaign
  • Vladimir Orlyanchik

    • University of Illinois at Urbana-Champaign
    • University of Illinois Urbana Champaign
  • Dale Van Harlingen

    • University of Illinois at Urbana-Champaign
    • University of Illinois Urbana Champaign
  • James N. Eckstein

    • University of Illinois Urbana Champaign
    • University of Illinis Urbana-Champaign
    • Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign