Electrical Transport Properties of Bi$_{2}$Te$_{3}$ Nanotubes and Nanowires

ORAL

Abstract

Electrical transport properties of promising topological insulator, Bi$_{2}$Te$_{3}$ nanowires and nanotubes are measured at different temperatures and magnetic field and the results are compared with the Bi$_{2}$Se$_{3}$ thin films. The nanotube and nanowire samples are synthesized by galvanostatic electrodepositon and solution phase methods, with diameters of 70nm (ex) and 50nm (in) for nanotubes and 80$\sim $100nm for nanowires, respectively. The contact leads (Pt) are fabricated by using Focusing Ion Beam (FIB). The magnetoresistance of Bi$_{2}$Te$_{3}$ nanotubes shows linear dependence as a function of magnetic field, with a notable peak around zero field. This is different from Bi$_{2}$Se$_{3}$ thin films which show quadratic behavior, with a significant dip near zero field. The results will be discussed based on the possible weak localization effect in the nanotubes in comparison with the weak anti-localization effect in the films.

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Authors

  • Renzhong Du

    • Department of Physics, The Pennsylvania State University, University Park, PA, USA
    • Department of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
    • The Pennsylvania State University

  • Jian Wang

    • Department of Physics, The Pennsylvania State University, University Park, PA, USA
    • Pennsylvania State University
    • Center for Nanoscale Science and Materials Research Institute, Penn State University, University Park PA 16802

  • Qi Li

    • Department of Physics, The Pennsylvania State University, University Park, PA, USA
    • Department of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
    • The Pennsylvania State University

  • Yuewei Yin

    • Hefei National Laboratory for Physical Sciences at Microscale, Department of Physics, University of Science and Technology of China, Hefei, China
    • Department of Physics, Pennsylvania State University, University Park, PA 16802, USA

  • Sining Dong

    • Hefei National Laboratory for Physical Sciences at Microscale, Department of Physics, University of Science and Technology of China, Hefei, China

  • Xiaoguang Li

    • Hefei National Laboratory for Physical Sciences at Microscale, Department of Physics, University of Science and Technology of China, Hefei, China