Solar cell evaluation using electron beam induced current with the large chamber scanning electron microscope

An initial study using electron beam induced current (EBIC) to evaluate solar cells has been carried out with the large chamber scanning electron microscope (LC-SEM) at the Western Kentucky University Nondestructive Analysis Center. EBIC is a scanning electron microscope technique used for the characterization of semiconductors. To facilitate our studies, we developed a Solar Amplification System (SASY) for analyzing current distribution and defects within a solar cell module. Preliminary qualitative results will be shown for a solar cell module that demonstrates the viability of the technique using the LC-SEM. Quantitative EBIC experiments will be carried out to analyze defects and minority carrier properties. Additionally, a well-focused spot of light from an LED mounted at the side of the SEM column will scan the same area of the solar cell using the LC-SEM positioning system. SASY will then output the solar efficiency to be compared with the~minority carrier properties found using EBIC.