Focus Session: Dopants and Defects in Semiconductors - Si and III-V

Presentations

• Dislocation nucleation in Si -- effect of Ge and vacancies

  ORAL

  Feb. 28, 2012, 11:15 AM – Feb. 28, 2012, 11:27 AM

  Authors

  • Zhi Li

    • Rensselaer Polytechnic Institute

  • Catalin Picu

    • Rensselaer Polytechnic Institute

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• Surface Charge Distribution on Hydrogen-Passivated Silicon Measured by UHV Kelvin Probe Microscopy

  ORAL

  Feb. 28, 2012, 11:27 AM – Feb. 28, 2012, 11:39 AM

  Authors

  • Pavel Nagornykh

    • University of Maryland

  • Kristen Burson

    • Center for Nanophysics and Adv. Mat. (CNAM), U. of Maryland, College Park
    • University of Maryland

  • William G. Cullen

    • Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742-4111
    • University of Maryland

  • Bruce Kane

    • University of Maryland

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• Magnetic resonance characterization of silicon nanowires

  ORAL

  Feb. 28, 2012, 11:39 AM – Feb. 28, 2012, 11:51 AM

  Authors

  • Marco Fanciulli

    • Department of Material Science, University of Milano Bicocca, Italy and MDM Laboratory, IMM-CNR, Agrate Brianza, Italy
    • Department of Material Science, University of Milano-Bicocca, Italy and MDM Laboratory, IMM-CNR, Agrate Brianza, Italy

  • Matteo Belli

    • MDM Laboratory, IMM-CNR, Agrate Brianza, Italy

  • Antonio Vellei

    • MDM Laboratory, IMM-CNR, Agrate Brianza, Italy

  • Carmen Canevali

    • Department of Material Science, University of Milano-Bicocca, Italy

  • Davide Rotta

    • Department of Material Science, University of Milano-Bicocca, Italy

  • Stefano Paleari

    • Department of Material Science, University of Milano-Bicocca, Italy

  • Martina Basini

    • Department of Material Science, University of Milano-Bicocca, Italy

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• Ab initio study of confinement effects and hyperfine structure in chalcogen doped Silicon nanostructures

  ORAL

  Feb. 28, 2012, 11:51 AM – Feb. 28, 2012, 12:03 PM

  Authors

  • Alberto Debernardi

    • CNR-IMM, MDM laboratory Agrate Brianza

  • Guido Petretto

    • CNR-IMM, MDM laboratory Agrate Brianza, University Milano-Bicocca

  • Andrea Masse

    • CNR-IMM, MDM laboratory Agrate Brianza, University Milano-Bicocca

  • Marco Fanciulli

    • CNR-IMM, MDM laboratory Agrate Brianza, University Milano-Bicocca

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• Segregation and diffusion of boron dopants in the Si/SiO$_2$ interface

  ORAL

  Feb. 28, 2012, 12:03 PM – Feb. 28, 2012, 12:15 PM

  Authors

  • Young Jun Oh

    • Department of Physics, Korea Advanced Institute of Science and Technology

  • Hyeon-Kyun Noh

    • Department of Physics, Korea Advanced Institute of Science and Technology

  • Geun-myung Kim

    • Department of Physics, Korea Advanced Institute of Science and Technology

  • K.J. Chang

    • Department of Physics, Korea Advanced Institute of Science and Technology

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• Hybrid functional calculations for native defects and dangling bonds in $\alpha$-Al$_2$O$_3$

  ORAL

  Feb. 28, 2012, 12:15 PM – Feb. 28, 2012, 12:27 PM

  Authors

  • Minseok Choi

    • Materials Department, University of California, Santa Barbara, CA 93106-5050

  • Anderson Janotti

    • Materials Department, University of California, Santa Barbara, CA 93106-5050

  • Chris G. Van de Walle

    • Materials Department, University of California, Santa Barbara, CA 93106-5050

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• Role of oxygen-related defects in hafnia

  ORAL

  Feb. 28, 2012, 12:27 PM – Feb. 28, 2012, 12:39 PM

  Authors

  • Manish Jain

    • Department of Physics, University of California, Berkeley and Lawrence Berkeley National Laboratory
    • University of California, Berkeley and Lawrence Berkeley National Laboratory
    • UC Berkeley and Lab Berkeley National Lab

  • James R. Chelikowsky

    • University of Texas, Austin

  • Steven G. Louie

    • Department of Physics, University of California, Berkeley and Lawrence Berkeley National Laboratory

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• Vibrational spectroscopy of cast Si used to fabricate solar cells: microscopic properties of nitrogen and oxygen impurities

  ORAL

  Feb. 28, 2012, 12:39 PM – Feb. 28, 2012, 12:51 PM

  Authors

  • Haoxiang Zhang

    • Lehigh University

  • Michael Stavola

    • Lehigh University

  • Mike Seacrist

    • MEMC Electronic Materials

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• The chemical trends of a new defect cluster: DDX centers

  ORAL

  Feb. 28, 2012, 12:51 PM – Feb. 28, 2012, 1:03 PM

  Authors

  • Jie Ma

    • national renewable energy laboratory

  • Su-Huai Wei

    • national renewable energy laboratory
    • National Renewable Energy Lab

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• Valence state manipulation of single Fe impurities in GaAs

  ORAL

  Feb. 28, 2012, 1:03 PM – Feb. 28, 2012, 1:15 PM

  Authors

  • Paul Koenraad

    • Eindhoven University of Technology

  • Juanita Bocquel

    • Eindhoven University of Technology

  • Victoria Kortan

    • University of Iowa

  • Michael Flatte

    • University of Iowa

  • Richard Campion

    • University of Nottingham

  • Bryan Gallagher

    • University of Nottingham

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• Local Environment Effects on Single Zn and Mn Acceptors in Gallium Arsenide

  ORAL

  Feb. 28, 2012, 1:15 PM – Feb. 28, 2012, 1:27 PM

  Authors

  • Nancy Santagata

    • The Ohio State University

  • Donghun Lee

    • The Ohio State University

  • Jay Gupta

    • The Ohio State University

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• Recombination dynamics of excitons bound to nitrogen isoelectronic centers in GaAs

  ORAL

  Feb. 28, 2012, 1:27 PM – Feb. 28, 2012, 1:39 PM

  Authors

  • Philippe St-Jean

    • \'Ecole Polytechnique de Montr\'eal

  • Gabriel \'Ethier-Majcher

    • \'Ecole Polytechnique de Montr\'eal

  • John F. Klem

    • Sandia National Laboratories

  • S\'ebastien Francoeur

    • \'Ecole Polytechnique de Montr\'eal

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• First-principles study of InX (X=P,Sb) semiconductors

  ORAL

  Feb. 28, 2012, 1:39 PM – Feb. 28, 2012, 1:51 PM

  Authors

  • Oscar D. Restrepo

    • The Ohio State University

  • Rohan Mishra

    • The Ohio State University

  • Wolfgang Windl

    • The Ohio State University

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• Simple intrinsic defects in GaP and InP

  ORAL

  Feb. 28, 2012, 1:51 PM – Feb. 28, 2012, 2:03 PM

  Authors

  • Peter Schultz

    • Sandia National Laboratories, Albuquerque, NM
    • Sandia National Labs

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• Defects in GaSb and InAs/GaSb superlattices

  ORAL

  Feb. 28, 2012, 2:03 PM – Feb. 28, 2012, 2:15 PM

  Authors

  • Jianwei Wang

    • Electrical and Computer Engineering, University of North Carolina at Charlotte

  • Yong Zhang

    • Electrical and Computer Engineering, University of North Carolina at Charlotte

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