The Corporate Feel: Atomic Force Microscopy in Industry

Presentations

• Accelerated design and quality control of impact modifiers for plastics through atomic force microscopy (AFM) analysis

  COFFEE_KLATCH · Invited

  March 24, 2011, 2:30 PM – March 24, 2011, 3:06 PM

  Authors

  • Gunter Moeller

    • Arkema Inc.

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• Scanning Probe Evaluation of Electronic, Mechanical and Structural Material Properties

  COFFEE_KLATCH · Invited

  March 24, 2011, 3:06 PM – March 24, 2011, 3:42 PM

  Authors

  • Kumar Virwani

    • IBM

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• Nanomechanical characterization of polypropylene-based materials with multifrequency atomic force microscopy (AFM)-based methods

  COFFEE_KLATCH · Invited

  March 24, 2011, 3:42 PM – March 24, 2011, 4:18 PM

  Authors

  • Dalia Yablon

    • Exxonmobil Research and Engineering

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• Probing Photovoltaic Performance

  COFFEE_KLATCH · Invited

  March 24, 2011, 4:18 PM – March 24, 2011, 4:54 PM

  Authors

  • David Ginger

    • University of Washington

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• Challenges and opportunities for probe-based information technology

  COFFEE_KLATCH · Invited

  March 24, 2011, 4:54 PM – March 24, 2011, 5:30 PM

  Authors

  • Jeremy Levy

    • U. Pittsburgh
    • University of Pittsburgh
    • Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260
    • U. of Pittsburgh

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