Observation of novel interference patterns in BixFe1-xTe3 by Fourier transform scanning tunneling spectroscopy (FT-STS)

ORAL

Abstract

We utilize Fourier transform scanning tunneling spectroscopy (FT-STS) to probe the surface of the magnetically doped TI, Bi2-xFexTe3. Our measurements show the appearance of a hitherto unobserved channel of electronic backscattering along the surface q-vector. By referencing the FT-STS with angle-resolved photoemission spectroscopy (ARPES) data, we formulate a simple model showing that these new vectors are fully consistent with spin-flip scattering. Our combined data therefore present compelling evidence for the first momentum resolved measurement of enhanced backscattering due to magnetic impurities in a prototypical TI.

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Authors

  • Yoshinori Okada

    • Boston College

  • Chetan Dhital

  • Wen-Wen Zhou

  • Hsin Lin

  • Susmita Basak

  • Arun Bansil

  • Yaobo Huang

  • Hong Ding

  • Ziqiang Wang

  • Stephen Wilson

  • Vidya Madhavan