Losses in Josephson junction resonators

ORAL

Abstract

Josephson junctions for superconducting circuits such as SQUIDs and qubits are conventionally based on Al-AlO$_x$-Al multilayer technology, which was shown to have a low quality factor and two-level-fluctuators in the dielectric AlO$_x$ as limiting decoherence source. By replacing the amorphous Al-rich tunnel oxide with nearly stoichiometric Al$_2$O$_3$ we aim to increase the qubit coherence times by reducing the number of dangling bonds in the Josephson tunnel junction. In this talk a test platform for loss determination in high-Q tunnel oxides based on junction resonators will be presented. We will show alternative tunnel junctions based on high temperature grown tunnel oxides.

Authors

  • Martin Weides

    • National Institute of Standards and Technology
    • National Institute for Standards and Technology, Boulder
  • Jiansong Gao

  • Jeffrey Kline

  • Michael Vissers

  • David Wisbey

  • David Pappas