Laser Scanning Microscopy of Few-Layer Graphene: Optical Reflectivity Contrast

ORAL

Abstract

We report laser scanning microscopy (LSM) of few-layer graphene, where a laser beam is raster scanned over the samples and the local reflectivity of the structure is directly measured through a silicon photodiode. The samples are grown by ambient-pressure chemical vapor deposition on copper foils, and transferred to SiO2/Si substrates, and consist of regions of single- and multi-layer graphene (D. R. Lenski, and M. S. Fuhrer, e-print arXiv: 1011.1683). While the local reflectivity of the structure depends on the thickness of the graphene layer, the LSM data is used to construct a two-dimensional reflectivity image of the sample which, in turn, enables identifying the local distribution of different graphene multilayers and local microscopic properties of the graphene sample.

*This work is supported by Department of Energy/High Energy Physics through grant number DESC0004950 and ONR through the Maryland AppEl, Task D10, through grant number N000140911190.

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Authors

  • Behnood Ghamsari

    • Center for Nanophysics and Advanced Materials, University of Maryland, College Park

  • A.P. Zhuravel

    • B. Verkin Institute for Low Temperature Physics \& Engineering, NAS of Ukraine
    • National Academy of Sciences of Ukraine

  • Daniel Lenski

    • Intel Corporation, 5200 NE Elam Young Parkway, Hillsboro, OR 97124

  • Michael Fuhrer

    • University of Maryland
    • Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742-4111, USA
    • Center for Nanophysics and Advanced Materials, University of Maryland, College Park
    • Center for Nanophysics and Advanced Materials, Univesity of Maryland
    • Materials Research Science and Engineering Center and Center for Nanophysics and Advanced Materials, Department of Physics, University of Maryland
    • Dept. of Physics, Materials Research Science and Engineering Center and Center for Nanophysics and Advanced Materials, Univ. of Maryland, College Park

  • S.M. Anlage

    • Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742-4111, USA
    • Center for Nanophysics and Advanced Materials, University of Maryland, College Park
    • University of Maryland