We have succeed in growing the LuFe2O4 polycrystalline thin film on the MgO(111) substrate with the Pulsed laser deposition(PLD) method. The surface structures, crystallographic and magnetic properties of the sample were characterized by XRD, AFM, SEM and SQUID. XRD pattern shows the sample crystallized in both (001) and (110) directions, which is also reflected in their morphological appearance in both AFM and SEM images. SQUID measurements reveal strong ferromagnetic signal in the thin film.
*Research sponsored by the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy.
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Authors
Wenbin Wang
University of Tennessee
University of Tennessee \& Oak Ridge National Lab
Xiaoshan Xu
Oak Ridge National Lab
Department of Chemistry, University of Tennessee
Zheng Gai
Oak Ridge National Lab
Oak Ridge National Laboratory \& Center for Nanophase Materials Science
Oak Ridge National Laboratory
Paul C. Snijders
Oak Ridge National Lab
Oak Ridge National Laboratory
T. Zac Ward
Oak Ridge National Lab
Oak Ridge National Laboratory
Jian Shen
Oak Ridge National Lab
The University of Tennessee, Knoxville \& Fudan University
